LEADER 04604nam 2200625 450 001 9910144717503321 005 20230421044544.0 010 $a1-281-84293-1 010 $a9786611842932 010 $a3-527-61595-4 010 $a3-527-61594-6 035 $a(CKB)1000000000377534 035 $a(EBL)481965 035 $a(OCoLC)289076492 035 $a(SSID)ssj0000207935 035 $a(PQKBManifestationID)11188728 035 $a(PQKBTitleCode)TC0000207935 035 $a(PQKBWorkID)10238670 035 $a(PQKB)10651621 035 $a(MiAaPQ)EBC481965 035 $a(EXLCZ)991000000000377534 100 $a20160820h19941994 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aNanoscale characterization of surfaces and interfaces /$fN. John DiNardo 210 1$aWeinheim, [Germany] :$cVCH,$d1994. 210 4$dİ1994 215 $a1 online resource (176 p.) 300 $aDescription based upon print version of record. 311 $a3-527-29247-0 320 $aIncludes bibliographical references. 327 $aNanoscale Characterization of Surfaces and Interfaces; Nanoscale Characterization of Surfaces and Interfaces; List of Symbols and Abbreviations; 1 Introduction; 2 Scanning Tunneling Microscopy (STM); 2.1 Historical Perspective; 2.2 Theory; 2.2.1 Electron Tunneling and STM Imaging; 2.2.2 Scanning Tunneling Spectroscopy (STS); 2.2.3 Inelastic Tunneling Spectroscopy; 2.2.4 Ballistic Electron Emission Microscopy (BEEM); 2.3 Instrumentation; 2.3.1 Microscope Design: STM Heads; 2.3.2 Tips; 2.3.3 Vibration and Shock Isolation; 2.3.4 Electronics; 2.3.5 Microcomputer Control 327 $a2.6.2 Surface Diffusion2.6.3 Stepped Surfaces; 2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces; 2.6.5 Growth of Metallic Adlayers; 2.6.6 Resistivity in Polycrystalline Metals - Scanning Tunneling Potentiometry; 2.7 Insulators; 2.8 Layered Compounds .; 2.9 Charge Density Wave Systems; 2.10 Superconductors; 2.11 Molecular Films, Adsorbates, and Surface Chemistry; 2.11.1 Molecular Imaging; 2.11.2 Adsorption and Surface Chemistry; 2.12 Electrochemistry at Liquid-Solid Interfaces; 2.1 3 Biological Systems; 2.14 Metrological Applications; 3 Atomic Force Microscopy 327 $a3.1 Atomic Force Imaging3.1.1 Graphite; 3.1.2 Insulators; 3.1.3 Metals; 3.1.4 Films; 3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates; 3.1.6 Biological Molecules; 3.1.7 Adsorption Dynamics of Biological Molecules in Real Time; 3.2 Nanoscale Surface Forces; 3.3 Nanotribology; 3.4 Non-Contact Imaging; 3.4.1 Van der Waals Forces; 3.4.2 Electrostatic Forces; 3.4.3 Magnetic Forces; 4 Manipulation of Atoms and Atom Clusters on the Nanoscale; 4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample; 4.2 Tip-Induced Lateral Motion of Atoms on Surfaces 327 $a4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption4.4 Nanoscale Chemical Modification; 4.5 High-Temperature Nanofabrication; 4.6 Nanoscale Surface Modification Using the AFM; 4.7 Towards Nanoscale Devices; 5 Spin-offs of STM - Non-Contact Nanoscale Probes; 5.1 Scanning Near-Field Optical Microscope (SNOM); 5.2 Photon Scanning Tunneling Microscope (PSTM); 5.3 Scanning Thermal Profiler (STP); 5.4 Scanning Chemical Potential Microscope (SCPM); 5.5 Optical Absorption Microscope (OAM); 5.6 Scanning Ion Conductance Microscope (SICM); 6 Acknowledgements; 7 References 330 $aDerived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.Topics include:Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charg 606 $aSurfaces (Physics) 606 $aScanning tunneling microscopy 606 $aNanotechnology 615 0$aSurfaces (Physics) 615 0$aScanning tunneling microscopy. 615 0$aNanotechnology. 676 $a530.427 676 $a620.44 700 $aDiNardo$b N. John$0522033 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910144717503321 996 $aNanoscale characterization of surfaces and interfaces$9835145 997 $aUNINA LEADER 01301nam 2200409 450 001 9910703531903321 005 20150501133055.0 035 $a(CKB)5470000002432384 035 $a(OCoLC)908259956 035 $a(EXLCZ)995470000002432384 100 $a20150501d2015 ua 0 101 0 $aeng 135 $aurmn||||||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aJob task analysis $ebuilding operations professional, February-December 2014 /$fCynthia D. Woodley 210 1$aGolden, Colorado :$cNational Renewable Energy Laboratory,$d2015. 215 $a1 online resource (vi, 90 pages) $ccolor illustrations 225 1 $aNREL/SR ;$v7A40-62330 300 $aTitle from title screen (viewed Apr. 30, 2015). 300 $a"January 2015." 517 $aJob task analysis 606 $aTask analysis 606 $aBuilding management$xAnalysis 606 $aJob descriptions 615 0$aTask analysis. 615 0$aBuilding management$xAnalysis. 615 0$aJob descriptions. 700 $aWoodley$b Cynthia D.$01394175 712 02$aNational Renewable Energy Laboratory (U.S.), 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910703531903321 996 $aJob task analysis$93451166 997 $aUNINA LEADER 02490nam 2200541 a 450 001 9911006524703321 005 20241120173225.0 010 $a0-89871-798-1 010 $a1-60119-020-4 024 7 $aOT84 035 $a(CKB)1000000000238244 035 $a(CaBNvSL)gtp00544287 035 $a(SSID)ssj0000391208 035 $a(PQKBManifestationID)12120225 035 $a(PQKBTitleCode)TC0000391208 035 $a(PQKBWorkID)10336505 035 $a(PQKB)11289619 035 $a(CaBNVSL)gtp00544287 035 $a(PPN)189903961 035 $a(SIAM)9780898717983 035 $a(EXLCZ)991000000000238244 071 50$aOT84$bSIAM 100 $a20101022d2004 uy 0 101 0 $aeng 135 $aurbn||||m|||a 181 $ctxt 182 $cc 183 $acr 200 00$aMarine acoustics $edirect and inverse problems /$fJames L. Buchanan ... [et al.] 210 $aPhiladelphia, Pa. $cSociety for Industrial and Applied Mathematics (SIAM, 3600 Market Street, Floor 6, Philadelphia, PA 19104)$d2004 215 $a1 electronic text (xii, 336 p. : ill.) $cdigital file 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-89871-547-4 320 $aIncludes bibliographical references (p. 299-331) and index. 327 $aPreface -- Chapter 1: The Mechanics of Continua -- Chapter 2: Direct Scattering Problems -- Chapter 3: Inverse Scattering in Ocean Environments -- Chapter 4: Oceans Over Elastic Basements -- Chapter 5: Shallow Oceans Over Poroelastic Seabeds -- Chapter 6: Homogenization of the Seabed and other Asymptotic Methods -- Index. 330 3 $aThis book presents current research trends in the field of underwater acoustic wave direct and inverse problems. Until very recently, little has been published concerning model-based inversions of the boundaries and material constants of finite-sized targets located either in the water column or the sediments. This text is the first to investigate inverse problems in an ocean environment with a heavy emphasis placed on the description and resolution of the forward scattering problem. 606 $aUnderwater acoustics 615 0$aUnderwater acoustics. 676 $a620.2/5 701 $aBuchanan$b James L$0535400 712 02$aSociety for Industrial and Applied Mathematics. 801 0$bCaBNVSL 801 1$bCaBNVSL 801 2$bCaBNVSL 906 $aBOOK 912 $a9911006524703321 996 $aMarine acoustics$94388976 997 $aUNINA