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035   $a(CKB)4330000001766820
035   $a(OCoLC)743886204
035   $a(EXLCZ)994330000001766820
100   $a20110801d2011      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aApplications of admittance spectroscopy in photovoltaic devices beyond majority-carrier trapping defects$b[electronic resource] $epreprint /$fJian V. Li ... [and others]
210  1$a[Golden, CO] :$cNational Renewable Energy Laboratory,$d[2011]
215   $a1 online resource (4 pages) $cillustrations (some color)
225 1 $aNREL/CP ;$v5200-50697
300   $aTitle from title screen (viewed August 1, 2011).
300   $a"July 2011."
300   $a"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
320   $aIncludes bibliographical references (page 4).
517   $aApplications of Admittance Spectroscopy in Photovoltaic Devices Beyond Majority Carrier Trapping Defects
606   $aPhotovoltaic cells$xResearch
606   $aPhotovoltaic cells$xDesign and construction
606   $aSpectrum analysis
615  0$aPhotovoltaic cells$xResearch.
615  0$aPhotovoltaic cells$xDesign and construction.
615  0$aSpectrum analysis.
701   $aLi$b Jian V$01413254
712 02$aNational Renewable Energy Laboratory (U.S.)
712 12$aIEEE Photovoltaic Specialists Conference$d(37th :$f2011 :$eSeattle, Wash.)
801  0$bSOE
801  1$bSOE
801  2$bGPO
906   $aBOOK
912   $a9910703293903321
996   $aApplications of admittance spectroscopy in photovoltaic devices beyond majority-carrier trapping defects$93509159
997   $aUNINA