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100   $a20110919d2011      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 12$aA novel approach for correlating capacitance data with performance during thin-film device stress studies$b[electronic resource] $epreprint /$fR.L. Graham and D.S. Albin, National Renewable Energy Laboratory, [and] L.A. Clark, Primestar Solar
210  1$aGolden, CO :$cNational Renewable Energy Laboratory,$d[2011]
215   $a1 online resource (8 pages) $cillustrations (some color)
225 1 $aNREL/CP ;$v5200-52392
300   $aTitle from title screen (viewed September 19, 2011).
300   $a"August 2011."
300   $a"Presented at the SPIE Optics + Photonics 2011, San Diego, California, August 21-25, 2011."
320   $aIncludes bibliographical references (page 8).
517   $aNovel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies 
606   $aPhotovoltaic cells$xResearch
606   $aElectric capacity
606   $aThin films$xPerformance
606   $aData mining$xComputer programs
615  0$aPhotovoltaic cells$xResearch.
615  0$aElectric capacity.
615  0$aThin films$xPerformance.
615  0$aData mining$xComputer programs.
700   $aGraham$b Rebekah L$01421683
701   $aAlbin$b David S$01382328
701   $aClark$b Laura A$01421684
712 02$aNational Renewable Energy Laboratory (U.S.)
712 02$aPrimestar Solar (Firm)
712 12$aSPIE Optics and Photonics Conference$f(2011 :$eSan Diego, Calif.)
801  0$bSOE
801  1$bSOE
801  2$bGPO
906   $aBOOK
912   $a9910703270403321
996   $aA novel approach for correlating capacitance data with performance during thin-film device stress studies$93543659
997   $aUNINA