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035   $a(EXLCZ)994330000001985076
100   $a20110204d2010      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aStep-stress accelerated degradation testing (SSADT) for photovoltaic (PV) devices and cells$b[electronic resource] /$fJinsuk Lee ... [and others]
210  1$a[Golden, Colo.] :$c[National Renewable Energy Laboratory],$d[2010]
215   $a1 online resource (15 unnumbered slides) $ccolor illustrations
225 1 $aNREL/PR ;$v2C00-49487
300   $aTitle from title screen (viewed on Jan. 28, 2011).
300   $a"2010 Workshop on Accelerated Stress Testing & Reliability (ASTR), October 6-8, 2010, Denver, CO."
320   $aIncludes bibliographical references (slide 15).
517   $aStep-Stress Accelerated Degradation Testing 
606   $aPhotovoltaic cells$xResearch
606   $aPhotovoltaic power systems$xReliability
615  0$aPhotovoltaic cells$xResearch.
615  0$aPhotovoltaic power systems$xReliability.
701   $aLee$b Jinsuk$f1978-$01388047
712 02$aNational Renewable Energy Laboratory (U.S.)
712 12$aWorkshop on Accelerated Stress Testing & Reliability$f(2010 :$eDenver, Colo.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910703201303321
996   $aStep-stress accelerated degradation testing (SSADT) for photovoltaic (PV) devices and cells$93498285
997   $aUNINA