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035   $a(CKB)4330000002012889
035   $a(OCoLC)707927543
035   $a(EXLCZ)994330000002012889
100   $a20110321d2011      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 04$aThe use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells$b[electronic resource] /$fD.S. Albin ... [and others]
210  1$a[Golden, CO] :$cNational Renewable Energy Laboratory,$d[2011]
215   $a1 online resource (7 pages) $ccolor illustrations
225 1 $aNREL/CP ;$v5200-48393
300   $aTitle from title screen (viewed March 21, 2011).
300   $a"March 2011."
300   $a"Presented at the 35th IEEE Photovoltaic Specialists Conference (PVSC '10), Honolulu, Hawaii, June 20-25, 2010."
320   $aIncludes bibliographical references (pages 6-7).
517 3 $aUse of second and third level correlation analysis for studying degradation in polycrystalline thin film solar cells
606   $aPhotovoltaic cells$xResearch
606   $aSolar cells$xTesting
606   $aThin films
615  0$aPhotovoltaic cells$xResearch.
615  0$aSolar cells$xTesting.
615  0$aThin films.
701   $aAlbin$b David S$01382328
712 02$aNational Renewable Energy Laboratory (U.S.)
712 12$aIEEE Photovoltaic Specialists Conference$f(2010 :$eHonolulu, Hawaii)
801  0$bSOE
801  1$bSOE
801  2$bGPO
906   $aBOOK
912   $a9910703179003321
996   $aThe use of 2nd and 3rd level correlation analysis for studying degradation in polycrystalline thin-film solar cells$93495394
997   $aUNINA