LEADER 01671nam 2200421Ka 450 001 9910702878303321 005 20090417140301.0 035 $a(CKB)4330000001986063 035 $a(OCoLC)318590856 035 $a(EXLCZ)994330000001986063 100 $a20090416d2008 ua 0 101 0 $aeng 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aStress induced degradation modes in CIGSS minimodules$b[electronic resource] /$fMike Kempe, Kent Terwilliger, and Dale Tarrant 210 1$aGolden, CO :$cNational Renewable Energy Laboratory,$d[2008] 215 $a18 unnumbered slides $cdigital, PDF file 225 1 $aNREL/PR ;$v520-43310 300 $aTitle from title screen (viewed Apr. 16, 2009). 300 $a"Presented at the 33rd IEEE Photovoltaic Specialist[s] Conference held May 11-16, 2008 in San Diego, California." 517 $aStress Induced Degradation Modes in CIGSS Minimodules 606 $aPhotovoltaic cells$xResearch$vCongresses 606 $aSolar cells$xTesting$vCongresses 608 $aConference papers and proceedings.$2lcgft 615 0$aPhotovoltaic cells$xResearch 615 0$aSolar cells$xTesting 700 $aKempe$b Michael D$01383404 701 $aTerwilliger$b Kent$01422804 701 $aTarrant$b D. E$g(Dale E.)$01385009 712 02$aNational Renewable Energy Laboratory (U.S.) 712 12$aIEEE Photovoltaic Specialists Conference$d(33rd :$f2008 :$eSan Diego, Calif.) 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910702878303321 996 $aStress induced degradation modes in CIGSS minimodules$93548327 997 $aUNINA