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100   $a20140911j19830711  ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aProperties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) /$fprincipal investigators: J. Lally and R. Meister
210  1$a[Washington, D.C.] :$cDepartment of Electrical Engineering, Catholic University of America :$cNational Aeronautics and Space Administration,$d11 July 1993.
215   $a1 online resource (16 pages, 3 unnumbered pages) $cillustrations
225 1 $aNASA-CR ;$v175156
300   $aTitle from title screen (viewed on Sept. 11, 2014).
300   $a"11 July 1993."
320   $aIncludes bibliographical references (pages 7-9).
517   $aProperties of material in the submillimeter wave region 
606   $aAttenuators$2nasat
606   $aBeam splitters$2nasat
606   $aCarbon dioxide lasers$2nasat
606   $aDielectric properties$2nasat
606   $aMach-Zehnder interferometers$2nasat
606   $aSubmillimeter waves$2nasat
615  7$aAttenuators.
615  7$aBeam splitters.
615  7$aCarbon dioxide lasers.
615  7$aDielectric properties.
615  7$aMach-Zehnder interferometers.
615  7$aSubmillimeter waves.
700   $aLally$b J.$01412862
702   $aMeister$b R.
712 02$aCatholic University of America.$bDepartment of Electrical Engineering,
712 02$aUnited States.$bNational Aeronautics and Space Administration,
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910702698403321
996   $aProperties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction)$93507815
997   $aUNINA