LEADER 02166nam  2200541   450 
001 9910702355703321
005 20130115125628.0
035   $a(CKB)5470000002426601
035   $a(OCoLC)824429141
035   $a(EXLCZ)995470000002426601
100   $a20130115d2012      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aNASA's Evolutionary Xenon Thruster (NEXT) Power Processing Unit (PPU) capacitor failure root cause analysis /$fJames F. Soeder [and four others]
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$d2012.
215   $a1 online resource (11 pages) $cillustrations (some color)
225 1 $aNASA/TM ;$v2012-217667
300   $aTitle from title screen (viewed on Dec. 28, 2012).
300   $a"August 2012."
300   $a"Prepared for the 10th International Energy Conversion Engineering Conference (IECEC) sponsored by the American Institute of Aeronautics and Astronautics, Atlanta, Georgia, July 30 to August 1, 2012."
320   $aIncludes bibliographical references (pages 11).
517   $aNASA's Evolutionary Xenon Thruster 
606   $aIon propulsion$2nasat
606   $aElectronic equipment tests$2nasat
606   $aCapacitors$2nasat
606   $aBeam switching$2nasat
606   $aFrequency distribution$2nasat
606   $aFailure analysis$2nasat
606   $aIon engines$2nasat
615  7$aIon propulsion.
615  7$aElectronic equipment tests.
615  7$aCapacitors.
615  7$aBeam switching.
615  7$aFrequency distribution.
615  7$aFailure analysis.
615  7$aIon engines.
700   $aSoeder$b James F.$01408620
712 02$aNASA Glenn Research Center,
712 12$aInternational Energy Conversion Engineering Conference$d(10th :$f2012 :$eAtlanta, Ga.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910702355703321
996   $aNASA's Evolutionary Xenon Thruster (NEXT) Power Processing Unit (PPU) capacitor failure root cause analysis$93533020
997   $aUNINA