LEADER 01758oam  2200517I  450 
001 9910702342703321
005 20121226125901.0
035   $a(CKB)5470000002426732
035   $a(OCoLC)822966133
035   $a(EXLCZ)995470000002426732
100   $a20121226d2012      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aSystematic destruction of electronic parts for aid in electronic failure analysis /$fS.E. Decker, T.D. Rolin, and P.D. McManus
210  1$aHuntsville, Alabama :$cNational Aeronautics and Space Administration, Marshall Space Flight Center,$d2012.
215   $a1 online resource (ix, 33 pages) $ccolor illustrations
225 1 $aNASA/TM ;$v2012-217462
300   $aTitle from title screen (viewed on Dec. 26, 2012).
300   $a"June 2012."
320   $aIncludes bibliographical references (page 33).
606   $aFailure analysis$2nasat
606   $aElectromechanics$2nasat
606   $aElectric potential$2nasat
606   $aTransistors$2nasat
606   $aAvionics$2nasat
606   $aFailure modes$2nasat
615  7$aFailure analysis.
615  7$aElectromechanics.
615  7$aElectric potential.
615  7$aTransistors.
615  7$aAvionics.
615  7$aFailure modes.
700   $aDecker$b S. E$01402218
701   $aRolin$b Terry$01395908
701   $aMcManus$b P. D$01402219
712 02$aGeorge C. Marshall Space Flight Center.
801  0$bGPO
801  1$bGPO
801  2$bGPO
906   $aBOOK
912   $a9910702342703321
996   $aSystematic destruction of electronic parts for aid in electronic failure analysis$93472296
997   $aUNINA