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035   $a(EXLCZ)995470000002422119
100   $a20120702d1977      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aCorrection factors for on-line microprobe analysis of multielement alloy systems$b[electronic resource] /$fJalaiah Unnam, Darrel R. Tenney, and William D. Brewer
210  1$aWashington, D.C. :$cNational Aeronautics and Space Administration, Scientific and Technical Information Office,$d1977.
215   $a1 online resource (v, 211 pages) $cillustrations
225 1 $aNASA reference publication ;$v1006
300   $aTitle from title screen (viewed on July 1, 2012).
300   $a"Performing organization, NASA Langley Research Center"--Rept. documentation p.
320   $aIncludes bibliographical references.
606   $aElectron probe microanalysis
606   $aAlloys$xAnalysis
606   $aMicroprobe analysis
606   $aX-ray microanalysis
615  0$aElectron probe microanalysis.
615  0$aAlloys$xAnalysis.
615  0$aMicroprobe analysis.
615  0$aX-ray microanalysis.
700   $aUnnam$b Jalaiah$01408474
701   $aTenney$b Darrel R$01408475
701   $aBrewer$b William D$0843166
712 02$aLangley Research Center.
712 02$aUnited States.$bNational Aeronautics and Space Administration.$bScientific and Technical Information Office.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910701999403321
996   $aCorrection factors for on-line microprobe analysis of multielement alloy systems$93492463
997   $aUNINA