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001 9910701929103321
005 20120809124531.0
035   $a(CKB)5470000002422829
035   $a(OCoLC)805570938
035   $a(EXLCZ)995470000002422829
100   $a20120809d2012      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aOn the effect of ramp rate in damage accumulation of the CPV die-attach$b[electronic resource] $epreprint /$fNick S. Bosco, Timothy J. Silverman, and Sarah R. Kurtz
210  1$a[Golden, CO] :$cNational Renewable Energy Laboratory,$d[2012]
215   $a1 online resource (6 pages) $cillustrations (some color)
225 1 $aConference paper NREL/CP ;$v5200-54092
300   $aTitle from title screen (viewed on Aug. 6, 2012).
300   $a"June 2012."
300   $a"Presented at the 2012 IEEE Photovoltaic Specialists Conference, Austin, Taxas, June 3-8, 2012."
320   $aIncludes bibliographical references (page 6).
517   $aOn the effect of ramp rate in damage accumulation of the CPV die-attach 
606   $aPhotovoltaic cells
606   $aSolder and soldering
615  0$aPhotovoltaic cells.
615  0$aSolder and soldering.
700   $aBosco$b Nick$01397004
701   $aSilverman$b Timothy J$01389992
701   $aKurtz$b S. R$01382404
712 02$aNational Renewable Energy Laboratory (U.S.)
712 12$aIEEE Photovoltaic Specialists Conference$f(2012 :$eAustin, Tex.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910701929103321
996   $aOn the effect of ramp rate in damage accumulation of the CPV die-attach$93458055
997   $aUNINA