LEADER 01403oam 2200433Ia 450 001 9910701473803321 005 20120223093522.0 035 $a(CKB)5470000002418337 035 $a(OCoLC)227954836 035 $a(EXLCZ)995470000002418337 100 $a20080513d2007 ua 0 101 0 $aeng 135 $aurbn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aSurface analysis of reactive ion etched PZT thin films in SF6 plasma$b[electronic resource] /$fEugene Zakar 210 1$aAdelphi, MD :$cArmy Research Laboratory,$d[2007] 215 $a1 online resource (iv, 10 pages) $cillustrations 225 1 $aARL-TR ;$v4284 300 $aTitle from title screen (viewed on Feb. 23, 2012). 300 $a"September 2007." 320 $aIncludes bibliographical references (pages 8-9). 606 $aSurfaces (Technology)$xAnalysis 606 $aThin films 606 $aPiezoelectricity 615 0$aSurfaces (Technology)$xAnalysis. 615 0$aThin films. 615 0$aPiezoelectricity. 700 $aZakar$b Eugene$01387268 712 02$aU.S. Army Research Laboratory. 801 0$bDTICE 801 1$bDTICE 801 2$bOCLCQ 801 2$bGPO 906 $aBOOK 912 $a9910701473803321 996 $aSurface analysis of reactive ion etched PZT thin films in SF6 plasma$93436893 997 $aUNINA