LEADER 01872nam  2200517Ia 450 
001 9910700708903321
005 20111027112414.0
035   $a(CKB)5470000002411922
035   $a(OCoLC)758856053
035   $a(EXLCZ)995470000002411922
100   $a20111027d2011      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aComponent-Level Electronic-Assembly Repair (CLEAR) synthetic instrument capabilities assessment and test report$b[electronic resource] /$fRichard C. Oeftering and Martin A. Bradish
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$d[2011]
215   $a1 online resource (v, 27 pages) $ccolor illustrations
225 1 $aNASA/TM ;$v2011-216953
300   $aTitle from title screen (viewed on Oct. 27, 2011).
300   $a"January 2011."
300   $a"CLEAR-RPT-004."
320   $aIncludes bibliographical references (page 27).
517   $aComponent-Level Electronic-Assembly Repair 
606   $aTeleoperators$2nasat
606   $aSpace logistics$2nasat
606   $aSpacecraft maintenance$2nasat
606   $aAstrionics$2nasat
606   $aDigital electronics$2nasat
606   $aAnalo$2nasat
615  7$aTeleoperators.
615  7$aSpace logistics.
615  7$aSpacecraft maintenance.
615  7$aAstrionics.
615  7$aDigital electronics.
615  7$aAnalo.
700   $aOeftering$b Richard C$01394742
701   $aBradish$b Martin A$01394743
712 02$aNASA Glenn Research Center.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910700708903321
996   $aComponent-Level Electronic-Assembly Repair (CLEAR) synthetic instrument capabilities assessment and test report$93452429
997   $aUNINA