LEADER 01631nam  2200493Ia 450 
001 9910700601403321
005 20110623080620.0
035   $a(CKB)5470000002409978
035   $a(OCoLC)732354876
035   $a(EXLCZ)995470000002409978
100   $a20110622d2011      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aLightning pin injection test$b[electronic resource] $eMOSFETS in "ON" state /$fJay J. Ely ... [and others]
210  1$aHampton, Va. :$cNational Aeronautics and Space Administration, Langley Research Center,$d[2011]
215   $a1 online resource (33 pages) $ccolor illustrations
225 1 $aNASA/TM ;$v2011-217047
300   $aTitle from title screen (viewed on June 22, 2011).
300   $a"January 2011."
320   $aIncludes bibliographical references (page 33).
517   $aLightning pin injection test 
606   $aX ray inspection$2nasat
606   $aDamage assessment$2nasat
606   $aLightning$2nasat
606   $aMetal oxide semiconductors$2nasat
606   $aOptical microscopes$2nasat
606   $aWaveforms$2nasat
615  7$aX ray inspection.
615  7$aDamage assessment.
615  7$aLightning.
615  7$aMetal oxide semiconductors.
615  7$aOptical microscopes.
615  7$aWaveforms.
701   $aEly$b Jay J$01414061
712 02$aLangley Research Center.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910700601403321
996   $aLightning pin injection test$93512163
997   $aUNINA