LEADER 01540nam  2200385Ia 450 
001 9910700529203321
005 20110930084709.0
035   $a(CKB)5470000002410707
035   $a(OCoLC)755076356
035   $a(EXLCZ)995470000002410707
100   $a20110930d2003      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 14$aThe impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration$b[electronic resource] /$fKate A. Remley
210  1$aBoulder, Colo. :$cU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,$d[2003]
215   $a1 online resource (iv, 64 pages) $ccolor illustrations
225 1 $aNIST technical note ;$v1528
300   $aTitle from title screen (viewed on Sept. 30, 2011).
300   $a"August 2003."
320   $aIncludes bibliographical references (pages 63-64).
606   $aOscilloscopes$xCalibration
606   $aFrequency response (Electrical engineering)
615  0$aOscilloscopes$xCalibration.
615  0$aFrequency response (Electrical engineering)
700   $aRemley$b Kate A$01392666
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910700529203321
996   $aThe impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration$93534800
997   $aUNINA