LEADER 01815nam 2200445Ia 450 001 9910700328403321 005 20110622154956.0 035 $a(CKB)5470000002409705 035 $a(OCoLC)732354255 035 $a(EXLCZ)995470000002409705 100 $a20110622d2011 ua 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aConformance test architecture for biometric data interchange formats$b[electronic resource] $eversion beta 2.0 /$fFernando L. Podio, Dylan Yaga, Mark Jerde 210 1$a[Gaithersburg, Md.] :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d[2011] 215 $a1 online resource (30 pages) $ccolor illustrations 225 1 $aNISTIR ;$v7771 300 $aTitle from title screen (viewed on June 22, 2011). 300 $a"February 2011." 320 $aIncludes bibliographical references (page 30). 517 $aConformance test architecture for biometric data interchange formats 606 $aBiometric identification$xComputer programs$xStandards 606 $aBiometric identification$xData processing 606 $aInternetworking (Telecommunication)$xStandards 615 0$aBiometric identification$xComputer programs$xStandards. 615 0$aBiometric identification$xData processing. 615 0$aInternetworking (Telecommunication)$xStandards. 700 $aPodio$b Fernando L$01381647 701 $aYaga$b Dylan$01396246 701 $aJerde$b Mark$01415036 712 02$aNational Institute of Standards and Technology (U.S.) 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910700328403321 996 $aConformance test architecture for biometric data interchange formats$93515933 997 $aUNINA