LEADER 01407nam  2200385Ia 450 
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005 20110329115236.0
035   $a(CKB)5470000002406859
035   $a(OCoLC)707090133
035   $a(EXLCZ)995470000002406859
100   $a20110314d2010      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aEvaluation of an electronic load for pulsed current characterization of power semiconductors$b[electronic resource] /$fTimothy E. Griffin
210  1$aAdelphi, MD :$cArmy Research Laboratory,$d[2010]
215   $a1 online resource (iv, 10 pages) $cillustrations (some color)
225 1 $aARL-TR ;$v5348
300   $aTitle from title screen (viewed on Mar. 14, 2011).
300   $a"September 2010."
320   $aIncludes bibliographical references (page 9).
606   $aPower semiconductors$xEvaluation
606   $aField-effect transistors$xTesting
615  0$aPower semiconductors$xEvaluation.
615  0$aField-effect transistors$xTesting.
700   $aGriffin$b Timothy E$01391748
712 02$aU.S. Army Research Laboratory.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910699910203321
996   $aEvaluation of an electronic load for pulsed current characterization of power semiconductors$93538177
997   $aUNINA