LEADER 01728nam  2200481Ia 450 
001 9910699506403321
005 20230902162105.0
035   $a(CKB)5470000002403867
035   $a(OCoLC)679689185
035   $a(EXLCZ)995470000002403867
100   $a20101108d2010      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aPower MOSFET thermal instability operation characterization support$b[electronic resource] /$fJohn L. Shue and Henning W. Leidecker
210  1$aHampton, Va. :$cNational Aeronautics and Space Administration, Langley Research Center,$d[2010]
215   $a1 online resource (iv, 16 pages) $cillustrations
225 1 $aNASA/TM- ;$v2010-216684
300   $aTitle from title screen (viewed on Nov. 8, 2010).
300   $a"April 2010."
320   $aIncludes bibliographical references (page 16)
410  0$aNASA technical memorandum ;$v216684.
606   $aMetal oxide semiconductors$2nasat
606   $aField effect transistors$2nasat
606   $aThermal instability$2nasat
606   $aCharge carriers$2nasat
606   $aGround support equipment$2nasat
615  7$aMetal oxide semiconductors.
615  7$aField effect transistors.
615  7$aThermal instability.
615  7$aCharge carriers.
615  7$aGround support equipment.
700   $aShue$b John L$01406244
701   $aLeidecker$b Henning W$01406245
712 02$aLangley Research Center.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910699506403321
996   $aPower MOSFET thermal instability operation characterization support$93484727
997   $aUNINA