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035   $a(CKB)5470000002402785
035   $a(OCoLC)793747629
035   $a(EXLCZ)995470000002402785
100   $a20120516d2006      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 12$aA current source method for tq measurement of fast switching thyristors$b[electronic resource] /$fJanis M. Niedra
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$d[2006]
215   $a1 online resource (7 pages) $cillustrations
225 1 $aNASA/CR ;$v2006-214260
300   $aTitle from title screen (viewed on Mar. 19, 2012).
300   $aSubscript "q" in title.
300   $a"November 2006."
300   $a"Preparing organization, QSS Group, Inc."--Rept. documentation p.
320   $aIncludes bibliographical references (page 3).
410  0$aNASA contractor report ;$vNASA CR-2006-214260.
517 3 $aCurrent source method for t[subscript q] measurement of fast switching thyristors
606   $aPulse generators$2nasat
606   $aSwitching$2nasat
606   $aThyristors$2nasat
606   $aCircuits$2nasat
615  7$aPulse generators.
615  7$aSwitching.
615  7$aThyristors.
615  7$aCircuits.
700   $aNiedra$b Janis M$01389258
712 02$aNASA Glenn Research Center.
712 02$aQSS Group, Inc.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910699313503321
996   $aA current source method for tq measurement of fast switching thyristors$93440549
997   $aUNINA