LEADER 01710oam  2200505Ka 450 
001 9910698853303321
005 20090515090541.0
035   $a(CKB)5470000002397332
035   $a(OCoLC)321040134
035   $a(EXLCZ)995470000002397332
100   $a20090515d1986      ua             0
101 0 $aeng
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aElectrical, structural and chemical characterization of Si sheet material$b[electronic resource] $eannual report /$fDieter G. Ast
210  1$aIthaca, NY :$cCornell University ;$a[Pasadena, CA] :$cJet Propulsion Laboratory,$d[1986?]
215   $a1 volume
225 1 $aNASA-CR ;$v179949
300   $aTitle from title screen (viewed May 14, 2009)
517   $aElectrical, structural and chemical characterization of Si sheet material 
606   $aChemical properties$2nasat
606   $aDendritic crystals$2nasat
606   $aElectrical properties$2nasat
606   $aMechanical properties$2nasat
606   $aRibbons$2nasat
606   $aSilicon films$2nasat
606   $aWebs (sheets)$2nasat
615  7$aChemical properties.
615  7$aDendritic crystals.
615  7$aElectrical properties.
615  7$aMechanical properties.
615  7$aRibbons.
615  7$aSilicon films.
615  7$aWebs (sheets)
700   $aAst$b D. G$g(Dieter G.)$01408249
712 02$aCornell University.
712 02$aJet Propulsion Laboratory (U.S.)
801  0$bGPO
801  1$bGPO
801  2$bGPO
906   $aBOOK
912   $a9910698853303321
996   $aElectrical, structural and chemical characterization of Si sheet material$93491664
997   $aUNINA