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005 20090528091642.0
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035   $a(EXLCZ)994330000001755146
100   $a20081117d2008      uy             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aAccelerated stress testing and diagnostic analysis of degradation in CdTe solar cells$b[electronic resource] /$fD.S. Albin
210  1$a[Golden, Colo.] :$cNational Renewable Energy Laboratory,$d[2008]
215   $a10 pages $cdigital, PDF file
225 1 $aConference paper ;$vNREL/CP-520-42811
300   $aTitle from title screen (viewed on May 28, 2009).
300   $a"Presented at the 2008 SPIE Optics+Photonics Meeting Reliability of Photovoltaic Cells, Modules, Components and Systems, San Diego, California, August 10-14, 2008."
300   $a"November 2008."
606   $aPhotovoltaic cells$xResearch
606   $aSolar cells
615  0$aPhotovoltaic cells$xResearch.
615  0$aSolar cells.
700   $aAlbin$b David S$01382328
712 02$aNational Renewable Energy Laboratory (U.S.)
801  0$bSOE
801  1$bSOE
801  2$bGPO
906   $aBOOK
912   $a9910698676303321
996   $aAccelerated stress testing and diagnostic analysis of degradation in CdTe solar cells$93509282
997   $aUNINA