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100   $a20060427d2005      ua             0
101 0 $aeng
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aCrystalline silicon short-circuit current degradation study$b[electronic resource] $einitial results /$fC.R. Osterwald, J. Pruett, and T. Moriarty
210  1$aGolden, Colo. :$cNational Renewable Energy Laboratory,$d[2005]
215   $a4 pages $cdigital, PDF file
225 1 $aConference paper ;$vNREL/CP-520-37357
300   $aTitle from title screen (viewed on Apr. 27, 2006).
300   $a"February 2005."
517   $aCrystalline Silicon Short-Circuit Current Degradation Study 
606   $aSilicon$xElectric properties
606   $aShort circuits
615  0$aSilicon$xElectric properties.
615  0$aShort circuits.
700   $aOsterwald$b C. R$01385253
701   $aPruett$b J$g(Jim)$01385254
701   $aMoriarty$b T$01385255
712 02$aNational Renewable Energy Laboratory (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910698273903321
996   $aCrystalline silicon short-circuit current degradation study$93432572
997   $aUNINA