LEADER 01284nam  2200385Ia 450 
001 9910698199803321
005 20090304163700.0
035   $a(CKB)5470000002395010
035   $a(OCoLC)312182327
035   $a(EXLCZ)995470000002395010
100   $a20090304d2007      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aReducing film thickness in lead zirconate titanate thin film capacitors$b[electronic resource] /$fVikram Rao and Ronald G. Polcawich
210  1$aAdelphi, MD :$cArmy Research Laboratory,$d[2007]
215   $avi, 16 pages $cdigital, PDF file
225 1 $aARL-TR ;$v4338
300   $aTitle from title screen (viewed March 4, 2009).
300   $a"December 2007."
606   $aFerroelectric thin films
606   $aFerroelectric devices
615  0$aFerroelectric thin films.
615  0$aFerroelectric devices.
700   $aRao$b Vikram$0968919
701   $aPolcawich$b Ronald G$01391990
712 02$aU.S. Army Research Laboratory.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910698199803321
996   $aReducing film thickness in lead zirconate titanate thin film capacitors$93546982
997   $aUNINA