LEADER 01642nam  2200433Ia 450 
001 9910698138703321
005 20100223155808.0
035   $a(CKB)5470000002395595
035   $a(OCoLC)526767429
035   $a(EXLCZ)995470000002395595
100   $a20100223d2006      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aNiton XLi 700 Series XRF Analyzer$b[electronic resource] /$fprepared by Tetra Tech EM Inc.; Stephen Billets
210  1$a[Las Vegas, NV] :$cU.S. Environmental Protection Agency, Office of Research and Development, National Exposure Research Laboratory,$d2006.
215   $a1 online resource (204 unnumbered pages) $ccolor illustrations
225 1 $aInnovative technology evaluation report
300   $aTitle from PDF title screen (viewed on Feb. 23, 2010).
300   $a"EPA/540/R-06/003."
300   $a"February 2006."
320   $aIncludes bibliographical references.
517 1 $aXRF technologies for measuring trace elements in soil and sediment : Niton XLi 700 Series XRF Analyzer
606   $aTrace elements$xMeasurement
606   $aSoils$xAnalysis
606   $aSediments (Geology)$xAnalysis
615  0$aTrace elements$xMeasurement.
615  0$aSoils$xAnalysis.
615  0$aSediments (Geology)$xAnalysis.
701   $aBillets$b Stephen$01399715
712 02$aNational Exposure Research Laboratory (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910698138703321
996   $aNiton XLi 700 Series XRF Analyzer$93465513
997   $aUNINA