LEADER 01897nam  2200445Ka 450 
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005 20100114144202.0
035   $a(CKB)5470000002395605
035   $a(OCoLC)498409363
035   $a(EXLCZ)995470000002395605
100   $a20100114d2006      ua             0
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aOxford X-Met 3000TX XRF analyzer$b[electronic resource] /$fprepared by Tetra Tech EM Inc. ; Stephen Billets
210  1$a[Washington, D.C.] :$cUnited States Environmental Protection Agency, Office of Research and Development, National Exposure Research Laboratory,$d[2006]
215   $a1 online resource (222 unnumbered pages) $ccolor illustrations
225 1 $aInnovative technology verification report
300   $aTitle from PDF title screen (viewed on Jan. 14, 2010).
300   $a"February 2006."
300   $a"EPA/540/R-06/008."
320   $aIncludes bibliographical references.
517 1 $aXRF technologies for measuring trace elements in soil and sediment
606   $aSoils$xAnalysis$xMeasurement$xTechnological innovations$zUnited States
606   $aSedimentation analysis$xMeasurement$xTechnological innovations$zUnited States
606   $aTrace elements$xMeasurement$xTechnological innovations$zUnited States
615  0$aSoils$xAnalysis$xMeasurement$xTechnological innovations
615  0$aSedimentation analysis$xMeasurement$xTechnological innovations
615  0$aTrace elements$xMeasurement$xTechnological innovations
701   $aBillets$b Stephen$01399715
712 02$aTetra Tech EM Inc.
712 02$aNational Exposure Research Laboratory (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910698137703321
996   $aOxford X-Met 3000TX XRF analyzer$93495715
997   $aUNINA