LEADER 01489oam  2200421   450 
001 9910698064603321
005 20171115112303.0
035   $a(CKB)5470000002394356
035   $a(OCoLC)227893842
035   $a(EXLCZ)995470000002394356
100   $a20080513j199905    ua             0
101 0 $aeng
135   $aurun|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 14$aThe detection of doped Cr presence in Sr0.6Ba0.4Nb2O3 by SIMS /$fUnchul Lee
210  1$aAdelphi, MD :$cArmy Research Laboratory,$dMay 1999.
215   $a1 online resource (iii, 12 pages) $cillustrations
225 1 $aARL-TN ;$v132
320   $aIncludes bibliographical references (page 6).
517 3 $aDetection of doped Cr presence in Sr(0.6)Ba(0.4)Nb2O3 by SIMS
517 3 $aDetection of doped chromium presence in Sr0.6Ba0.4Nb2O3 by SIMS
517 3 $aDetection of doped chromium presence in Sr0.6Ba0.4Nb2O3 by Secondary Ion Mass Spectrometry
606   $aPhotorefractive materials
606   $aSecondary ion mass spectrometry
615  0$aPhotorefractive materials.
615  0$aSecondary ion mass spectrometry.
700   $aLee$b Unchul$01387554
712 02$aU.S. Army Research Laboratory,
801  0$bDTICE
801  1$bDTICE
801  2$bOCLCQ
801  2$bGPO
906   $aBOOK
912   $a9910698064603321
996   $aThe detection of doped Cr presence in Sr0.6Ba0.4Nb2O3 by SIMS$93528114
997   $aUNINA