LEADER 01419nam  2200397Ia 450 
001 9910697264403321
005 20230902161553.0
035   $a(CKB)5470000002386277
035   $a(OCoLC)646185662
035   $a(EXLCZ)995470000002386277
100   $a20100707d1994      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aFlux-focusing eddy current probe and method for flaw detection$b[electronic resource] /$finventor, John W. Simpson ... [and others]
205   $a[Redacted ed.]
210  1$a[Washington, DC] :$c[National Aeronautics and Space Administration],$d[1994]
215   $a1 online resource $cillustrations
225 1 $aNASA case ;$vno. LAR 15046-1
300   $aTitle from PDF title screen (NASA, viewed July 1, 2010).
410  0$aNASA case ;$vLAR-15046-1.
517 3 $aFlux focusing eddy current probe and method for flaw detection
606   $aEddy currents (Electric)
606   $aMagnetic flux
615  0$aEddy currents (Electric)
615  0$aMagnetic flux.
701   $aSimpson$b John W$01352069
712 02$aUnited States.$bNational Aeronautics and Space Administration.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910697264403321
996   $aFlux-focusing eddy current probe and method for flaw detection$93516393
997   $aUNINA