LEADER 02189nam  2200613Ia 450 
001 9910697260803321
005 20230902161607.0
035   $a(CKB)5470000002386313
035   $a(OCoLC)646196430
035   $a(EXLCZ)995470000002386313
100   $a20100707d1994      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aFlux-focusing eddy current probe and rotating probe method for flaw detection$b[electronic resource] /$finventor, Buzz A. Wincheski ... [and others]
205   $a[Redacted ed.]
210  1$a[Washington, DC] :$c[National Aeronautics and Space Administration],$d[1994]
215   $a1 online resource $cillustrations
225 1 $aNASA case ;$vno. LAR 15231-1
300   $aTitle from PDF title screen (NASA, viewed July 6, 2010).
410  0$aNASA case ;$vLAR-15231-1.
517 3 $aFlux focusing eddy current probe and rotating probe method for flaw detection
606   $aCrack propagation$2nasat
606   $aEddy currents$2nasat
606   $aElectromagnetic measurement$2nasat
606   $aFatigue (materials)$2nasat
606   $aFault detection$2nasat
606   $aMagnetic flux$2nasat
606   $aNondestructive tests$2nasat
606   $aEddy currents (Electric)
606   $aElectromagnetic measurements
606   $aMaterials$xFatigue
606   $aNondestructive testing
615  7$aCrack propagation.
615  7$aEddy currents.
615  7$aElectromagnetic measurement.
615  7$aFatigue (materials)
615  7$aFault detection.
615  7$aMagnetic flux.
615  7$aNondestructive tests.
615  0$aEddy currents (Electric)
615  0$aElectromagnetic measurements.
615  0$aMaterials$xFatigue.
615  0$aNondestructive testing.
701   $aWincheski$b Buzz A$01390039
712 02$aUnited States.$bNational Aeronautics and Space Administration.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910697260803321
996   $aFlux-focusing eddy current probe and rotating probe method for flaw detection$93442308
997   $aUNINA