LEADER 01847nam  2200493Ka 450 
001 9910697237003321
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024 8 $aGOVPUB-C13-02a57171bcff2c85a25ac0d7e401bf31
035   $a(CKB)5470000002386554
035   $a(OCoLC)245532636
035   $a(OCoLC)713043947$z(OCoLC)947049328$z(OCoLC)994340407
035   $a(OCoLC)947047630
035   $a(EXLCZ)995470000002386554
100   $a20080905d2007      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aSemiconductor microelectronics and nanoelectronics programs$b[electronic resource] /$fedited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley
210  1$a[Gaithersburg, Md.] :$cNIST, Technology Administration, U.S. Dept. of Commerce,$d[2007]
215   $avii, 244 pages $cdigital, PDF file
225 1 $aNISTIR ;$v7426
300   $aTitle from title screen (viewed Sept. 5, 2008).
320   $aIncludes bibliographical references.
606   $aSemiconductors$xMeasurement
606   $aNanotechnology$xResearch
606   $aMolecular electronics$xResearch
606   $aMicroelectronics$xResearch
615  0$aSemiconductors$xMeasurement.
615  0$aNanotechnology$xResearch.
615  0$aMolecular electronics$xResearch.
615  0$aMicroelectronics$xResearch.
700   $aKnight$b Stephen$0449894
701   $aKnight$b Stephen$0449894
701   $aPinillos$b Joaquin V. Martinez de$01422149
701   $aBuckley$b Michele$01422150
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910697237003321
996   $aSemiconductor microelectronics and nanoelectronics programs$93545547
997   $aUNINA