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100   $a20110907d2008      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aUncertainty analysis for NIST noise-parameter measurements$b[electronic resource] /$fJames Randa
210  1$aBoulder, CO :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d[2008]
215   $a1 online resource (iii, 31 pages) $cillustrations (some color)
225 1 $aNIST technical note ;$v1530
300   $aTitle from title screen (viewed on Sept. 7, 2011).
300   $a"March 2008."
300   $a"CODEN: NTNOEF"--T.p. verso.
320   $aIncludes bibliographical references (pages 22-24).
410  0$aNIST technical note ;$v1530.
606   $aElectronic noise$xMeasurement
606   $aUncertainty (Information theory)$xMathematical models
615  0$aElectronic noise$xMeasurement.
615  0$aUncertainty (Information theory)$xMathematical models.
700   $aRanda$b James$045191
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910697199403321
996   $aUncertainty analysis for NIST noise-parameter measurements$93445050
997   $aUNINA