LEADER 01393nam  2200409Ia 450 
001 9910697176703321
005 20230902161607.0
035   $a(CKB)5470000002385143
035   $a(OCoLC)690897078
035   $a(EXLCZ)995470000002385143
100   $a20101209d2004      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aDesign and test evaluation of SiC diode modules$b[electronic resource] /$fby Timothy E. Griffin and M. Gail Koebke
210  1$aAdelphi, MD :$cArmy Research Laboratory,$d[2004]
215   $a1 online resource (vi, 36 pages) $ccolor illustrations
225 1 $aARL-TR ;$v3222
300   $aTitle from title screen (viewed on Dec. 8, 2010).
300   $a"May 2004."
320   $aIncludes bibliographical references.
410  0$aARL-TR (Aberdeen Proving Ground, Md.) ;$v3222.
606   $aSilicon carbide
606   $aDiodes, Schottky-barrier$xEvaluation
615  0$aSilicon carbide.
615  0$aDiodes, Schottky-barrier$xEvaluation.
700   $aGriffin$b Timothy E$01391748
701   $aKoebke$b M. Gail$01391749
712 02$aU.S. Army Research Laboratory.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910697176703321
996   $aDesign and test evaluation of SiC diode modules$93445781
997   $aUNINA