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001 9910697001903321
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035   $a(CKB)5470000002384888
035   $a(OCoLC)639286820
035   $a(EXLCZ)995470000002384888
100   $a20100608d2005      ua             0
101 0 $aeng
135   $aurmn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aEvaluation of the submodeling technique for analyzing electronic components$b[electronic resource]$fBrian M. Powers and David A. Hopkins
210  1$aAberdeen Proving Ground, MD :$cArmy Research Laboratory,$d[2005]
215   $a1 online resource (iv, 19 pages) $cillustrations
225 1 $aARL-TR ;$v3627
300   $aTitle from PDF title screen (viewed June 8, 2010).
300   $a"October 2005."
320   $aIncludes bibliographical references (page 8).
410  0$aARL/TR ;$v3627.
606   $aElectronic circuits$xTesting$xEvaluation
606   $aSubmodular functions$xAnalysis
615  0$aElectronic circuits$xTesting$xEvaluation.
615  0$aSubmodular functions$xAnalysis.
700   $aPowers$b Brian M$01391046
701   $aHopkins$b David A$0306586
712 02$aU.S. Army Research Laboratory.
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910697001903321
996   $aEvaluation of the submodeling technique for analyzing electronic components$93444317
997   $aUNINA