LEADER 01327nam  2200349Ka 450 
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005 20060327172015.0
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035   $a(EXLCZ)995470000002365546
100   $a20060327d2005      ua             0
101 0 $aeng
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aAFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se? thin films$b[electronic resource] /$fC.-S. Jiang ... [and others]
210  1$aGolden, Colo. :$cNational Renewable Energy Laboratory,$d[2005]
215   $a1 volume $cdigital, PDF file
225 1 $aConference paper ;$vNREL/CP-520-37338
300   $aTitle from title screen (viewed on Mar. 27, 2006).
300   $a"February 2005."
517   $aAFM-based microelectrical characterization of grain boundaries in Cu
606   $aThin films$xElectric properties
615  0$aThin films$xElectric properties.
701   $aJiang$b C.-S$g(Chun-Sheng)$01384256
712 02$aNational Renewable Energy Laboratory (U.S.)
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910694816803321
996   $aAFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se? thin films$93430307
997   $aUNINA