LEADER 01568nam 2200361z- 450 001 9910694401403321 005 20130604084932.0 035 $a(CKB)5860000000021124 035 $a(BIP)014088203 035 $a(EXLCZ)995860000000021124 100 $a20220406c2007uuuu -u- - 101 0 $aeng 200 10$aDHS's procurement process regarding its contracts with Shirlington Limousine and Transportation, Inc. $ehearing before the Subcommittee on Management, Integration, and Oversight of the Committee on Homeland Security, House of Representatives, One Hundred Ninth Congress, second session, June 15, 2006 215 $a1 online resource (iii, 43 p.) 311 $a0-16-078378-X 517 $aDHS's procurement process regarding its contracts with Shirlington Limousine and Transportation, Inc. 606 $aContracting out$zUnited States 606 $aGovernment contractors$zUnited States 606 $aEmployee screening$zUnited States 610 $aUnited States 610 $aPublic contracts 610 $aContracting out 610 $aPolitical science 610 $aLaw 610 $aBusiness & economics 615 0$aContracting out 615 0$aGovernment contractors 615 0$aEmployee screening 712 02$aUnited States, Congress House Committee on Homeland Security Subcommittee on Management, Integration, and Oversight Staff,$4oth 906 $aBOOK 912 $a9910694401403321 996 $aDHS's procurement process regarding its contracts with Shirlington Limousine and Transportation, Inc$93197311 997 $aUNINA LEADER 03401nam 22006735 450 001 9910299666303321 005 20251223155422.0 010 $a1-4614-4078-5 024 7 $a10.1007/978-1-4614-4078-9 035 $a(CKB)3710000000277386 035 $a(EBL)1964795 035 $a(OCoLC)894893521 035 $a(SSID)ssj0001386211 035 $a(PQKBManifestationID)11767082 035 $a(PQKBTitleCode)TC0001386211 035 $a(PQKBWorkID)11368920 035 $a(PQKB)10589221 035 $a(DE-He213)978-1-4614-4078-9 035 $a(MiAaPQ)EBC1964795 035 $a(PPN)183085272 035 $a(EXLCZ)993710000000277386 100 $a20141108d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aCircuit Design for Reliability /$fedited by Ricardo Reis, Yu Cao, Gilson Wirth 205 $a1st ed. 2015. 210 1$aNew York, NY :$cSpringer New York :$cImprint: Springer,$d2015. 215 $a1 online resource (271 p.) 300 $aDescription based upon print version of record. 311 08$a1-4614-4077-7 320 $aIncludes bibliographical references at the end of each chapters. 327 $aIntroduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs. 330 $aThis book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations. 606 $aElectronic circuits 606 $aSecurity systems 606 $aComputer-aided engineering 606 $aElectronic Circuits and Systems 606 $aSecurity Science and Technology 606 $aComputer-Aided Engineering (CAD, CAE) and Design 615 0$aElectronic circuits. 615 0$aSecurity systems. 615 0$aComputer-aided engineering. 615 14$aElectronic Circuits and Systems. 615 24$aSecurity Science and Technology. 615 24$aComputer-Aided Engineering (CAD, CAE) and Design. 676 $a620 676 $a620.00420285 676 $a621.3815 676 $a658.56 702 $aReis$b Ricardo$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aCao$b Yu$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aWirth$b Gilson$4edt$4http://id.loc.gov/vocabulary/relators/edt 906 $aBOOK 912 $a9910299666303321 996 $aCircuit Design for Reliability$91412260 997 $aUNINA