LEADER 01628nam 2200385 450 001 9910688390103321 005 20230704142053.0 035 $a(CKB)5850000000050350 035 $a(NjHacI)995850000000050350 035 $a(EXLCZ)995850000000050350 100 $a20230704d2022 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aActive Learning /$fedited by Olena Lutsenko, Gregory Lutsenko 210 1$aLondon :$cIntechOpen,$d2022. 210 4$dİ2022 215 $a1 online resource (176 pages) 311 $a1-83968-478-X 320 $aIncludes bibliographical references and index. 330 $aIn the context of globalization changes in educational systems, it is important to modify approaches to the educational process and introduce learning technologies that allow for maximum involvement in learning. One such technology is the technology of active learning, which engages learners through participation in the cognitive process and certain tasks as well as through the collective activities of the subjects of the educational process. This book discusses the theoretical analysis of active learning and contains practical recommendations for its implementation. 517 $aActive Learning 606 $aActive learning 615 0$aActive learning. 676 $a371.39 702 $aLutsenko$b Gregory 702 $aLutsenko$b Olena 801 0$bNjHacI 801 1$bNjHacl 906 $aBOOK 912 $a9910688390103321 996 $aActive Learning$92957216 997 $aUNINA LEADER 01994nam 2200517 450 001 9910705840803321 005 20170802143201.0 035 $a(CKB)5470000002454010 035 $a(OCoLC)998837503 035 $a(EXLCZ)995470000002454010 100 $a20170802j199808 ua 0 101 0 $aeng 135 $aurbn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aPerformance of surface-mount ceramic and solid tantalum capacitors for cryogenic applications /$fAhmad Hammoud [and three others] 210 1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Lewis Research Center,$dAugust 1998. 215 $a1 online resource (5 pages) $cillustrations 225 1 $aNASA/TM ;$v1998-208489 300 $a"August 1998." 300 $a"Prepared for the Electrical Insulation and Dielectric Phenomena sponsored by the Institute of Electrical and Electronics Engineers, Atlanta, Georgia, October 25-28, 1998." 300 $a"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page. 320 $aIncludes bibliographical references (page 5). 606 $aCapacitors$2nasat 606 $aCryogenics$2nasat 606 $aLow temperature$2nasat 606 $aLiquid nitrogen$2nasat 606 $aDielectric properties$2nasat 606 $aCommunication satellites$2nasat 606 $aCeramics$2nasat 615 7$aCapacitors. 615 7$aCryogenics. 615 7$aLow temperature. 615 7$aLiquid nitrogen. 615 7$aDielectric properties. 615 7$aCommunication satellites. 615 7$aCeramics. 700 $aHammoud$b Ahmad N.$01404498 712 02$aLewis Research Center, 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910705840803321 996 $aPerformance of surface-mount ceramic and solid tantalum capacitors for cryogenic applications$93533873 997 $aUNINA