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010   $a3-031-06616-2
024 7 $a10.1007/978-3-031-06616-0
035   $a(CKB)5840000000241942
035   $a(DE-He213)978-3-031-06616-0
035   $a(MiAaPQ)EBC7236583
035   $a(Au-PeEL)EBL7236583
035   $a(PPN)269658823
035   $a(MiAaPQ)EBC7235382
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100   $a20230406d2023      u|         0
101 0 $aeng
135   $aurnn|008mamaa
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aThin Films $eProcesses and Characterization Techniques /$fby Nicoleta Nedelcu
205   $a1st ed. 2023.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2023.
215   $a1 online resource (X, 124 p. 94 illus., 79 illus. in color.) 
311 08$a3-031-06615-4 
320   $aIncludes bibliographical references and index.
327   $aChapter 1. Introduction -- Chapter 2. Thin layer method -- Chapter 3. Vacuum thin film deposition installation -- Chapter 4. Method for characterizing thin layer -- Chapter 5. Study of optical and chemical properties.
330   $aThe book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials? physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.
606   $aSurfaces (Technology)
606   $aThin films
606   $aMaterials$xAnalysis
606   $aProduction engineering
606   $aMaterials
606   $aSurfaces, Interfaces and Thin Film
606   $aMaterials Characterization Technique
606   $aProcess Engineering
606   $aMaterials Engineering
606   $aMaterials for Devices
615  0$aSurfaces (Technology)
615  0$aThin films.
615  0$aMaterials$xAnalysis.
615  0$aProduction engineering.
615  0$aMaterials.
615 14$aSurfaces, Interfaces and Thin Film.
615 24$aMaterials Characterization Technique.
615 24$aProcess Engineering.
615 24$aMaterials Engineering.
615 24$aMaterials for Devices.
676   $a621.38152
700   $aNedelcu$b Nicoleta$01354243
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910686473103321
996   $aThin Films$93313909
997   $aUNINA