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010   $a9789811968723$b(electronic bk.)
010   $z9789811968716
024 7 $a10.1007/978-981-19-6872-3
035   $a(MiAaPQ)EBC7133281
035   $a(Au-PeEL)EBL7133281
035   $a(CKB)25299342900041
035   $a(PPN)266350585
035   $a(DE-He213)978-981-19-6872-3
035   $a(OCoLC)1350552367
035   $a(EXLCZ)9925299342900041
100   $a20221107d2022      u|         0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aStructure and Electronic Properties of Ultrathin In Films on Si(111) /$fby Shigemi Terakawa
205   $a1st ed. 2022.
210  1$aSingapore :$cSpringer Nature Singapore :$cImprint: Springer,$d2022.
215   $a1 online resource (83 pages)
225 1 $aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5061
311 08$aPrint version: Terakawa, Shigemi Structure and Electronic Properties of Ultrathin in Films on Si(111) Singapore : Springer,c2022 9789811968716 
320   $aIncludes bibliographical references.
327   $a1. Introduction -- 2. Experimental methods -- 3. Structure and electronic properties of In single-layer metal on Si(111) -- 4. Structure and electronic properties of ultrathin (In, Mg) films on Si(111) -- 5. Summary.
330   $aThis book reports the establishment of a single-atomic layer metal of In and a novel (In, Mg) ultrathin film on Si(111) surfaces. A double-layer phase of In called ?rect? has been extensively investigated as a two-dimensional metal. Another crystalline phase called ?hex? was also suggested, but it had not been established due to difficulty in preparing the sample. The author succeeded in growing the large and high-quality sample of the hex phase and revealed that it is a single-layer metal. The author also established a new triple-atomic layer (In, Mg) film with a nearly freestanding character by Mg deposition onto the In double layer. This work proposes a novel method to decouple ultrathin metal films from Si dangling bonds. The present study demonstrates interesting properties of indium itself, which is a p-block metal both with metallicity and covalency. In this book, readers also see principles of various surface analysis techniques and learn how to use them and analyze the results in the real systems. This book is useful to researchers and students interested in surface science, particularly ultrathin metal films on semiconductor surfaces.
410  0$aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5061
606   $aSurfaces (Technology)
606   $aThin films
606   $aSurfaces (Physics)
606   $aMetals
606   $aMaterials$xAnalysis
606   $aChemistry, Inorganic
606   $aDensity functionals
606   $aSurfaces, Interfaces and Thin Film
606   $aSurface and Interface and Thin Film
606   $aMetals and Alloys
606   $aCharacterization and Analytical Technique
606   $aInorganic Chemistry
606   $aDensity Functional Theory
615  0$aSurfaces (Technology)
615  0$aThin films.
615  0$aSurfaces (Physics)
615  0$aMetals.
615  0$aMaterials$xAnalysis.
615  0$aChemistry, Inorganic.
615  0$aDensity functionals.
615 14$aSurfaces, Interfaces and Thin Film.
615 24$aSurface and Interface and Thin Film.
615 24$aMetals and Alloys.
615 24$aCharacterization and Analytical Technique.
615 24$aInorganic Chemistry.
615 24$aDensity Functional Theory.
676   $a621.38171
700   $aTerakawa$b Shigemi$01265780
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
912   $a9910629294203321
996   $aStructure and Electronic Properties of Ultrathin in Films on Si(111)$92968231
997   $aUNINA