LEADER 01840nas  2200505-a 450 
001 9910626169603321
005 20200118055916.2
011   $a1558-1780
035   $a(OCoLC)47954091
035   $a(CKB)991042723557750
035   $a(CONSER)--2001242176
035   $a(EXLCZ)99991042723557750
100   $a20010912b199u2003  s--            a
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aProceedings /$fEuropean Test Workshop
210   $aLos Alamitos, Calif. $cIEEE Computer Society ;$aPiscataway, NJ $cIEEE Service Center$d-©2003
311   $a1530-1877 
517 1 $aIEEE European Test Workshop
517 1 $aETW
531   $aIEEE EUROPEAN TEST SYMPOSIUM
606   $aIntegrated circuits$xTesting$vCongresses
606   $aAutomatic test equipment$vCongresses
606   $aElectronic digital computers$xCircuits$xTesting$vCongresses
606   $aAutomatic test equipment$2fast$3(OCoLC)fst01432130
606   $aElectronic digital computers$xCircuits$xTesting$2fast$3(OCoLC)fst00907134
606   $aIntegrated circuits$xTesting$2fast$3(OCoLC)fst00975593
608   $aPeriodicals.$2fast
608   $aConference papers and proceedings.$2fast
615  0$aIntegrated circuits$xTesting
615  0$aAutomatic test equipment
615  0$aElectronic digital computers$xCircuits$xTesting
615  7$aAutomatic test equipment.
615  7$aElectronic digital computers$xCircuits$xTesting.
615  7$aIntegrated circuits$xTesting.
676   $a621
712 02$aIEEE Computer Society.$bTest Technology Technical Committee.
712 02$aInstitute of Electrical and Electronics Engineers.
906   $aCONFERENCE
912   $a9910626169603321
996   $aProceedings$957126
997   $aUNINA