LEADER 03494oas 2201201 a 450 001 9910625186403321 005 20260127110450.0 011 $a1941-0123 035 $a(DE-599)ZDB2039806-2 035 $a(OCoLC)44579008 035 $a(CONSER) 2006238366 035 $a(CKB)958480155083 035 $a(DE-599)2039806-2 035 $a(EXLCZ)99958480155083 100 $a20000713a19989999 sy a 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE instrumentation & measurement magazine 210 $aNew York, NY $cInstitute of Electrical and Electronics Engineers$dİ1998- 300 $aRefereed/Peer-reviewed 300 $aTitle from IEEExplore homepage (viewed Jul. 13, 2000). 311 08$aPrint version: IEEE instrumentation & measurement magazine 1094-6969 (DLC) 98658073 (OCoLC)37313844 517 3 $aIEEE instrumentation and measurement magazine 517 1 $aI & M magazine 517 1 $aInstrumentation & measurement 531 0 $aIEEE instrum. meas. mag. 606 $aIndustrial electronics$vPeriodicals 606 $aElectronic instruments$vPeriodicals 606 $aMeasurement$vPeriodicals 606 $aTesting$vPeriodicals 606 $aMeasurement$vPeriodicals 606 $aTesting$xPeriodicals 606 $aAppareils e?lectroniques$xPe?riodiques 606 $aMesure$xPe?riodiques 606 $aEssais (Technologie)$xPe?riodiques 606 $aE?lectronique industrielle$vPe?riodiques 606 $aAppareils e?lectroniques$vPe?riodiques 606 $aMesure$vPe?riodiques 606 $aEssais (Technologie)$vPe?riodiques 606 $aElectronic instruments$2fast$3(OCoLC)fst00907299 606 $aIndustrial electronics$2fast$3(OCoLC)fst00970985 606 $aMeasurement$2fast$3(OCoLC)fst01715944 606 $aTesting$2fast$3(OCoLC)fst01148240 608 $aPeriodicals.$2fast 615 0$aIndustrial electronics 615 0$aElectronic instruments 615 0$aMeasurement 615 0$aTesting 615 0$aMeasurement 615 0$aTesting$xPeriodicals. 615 6$aAppareils e?lectroniques$xPe?riodiques. 615 6$aMesure$xPe?riodiques. 615 6$aEssais (Technologie)$xPe?riodiques. 615 6$aE?lectronique industrielle 615 6$aAppareils e?lectroniques 615 6$aMesure 615 6$aEssais (Technologie) 615 7$aElectronic instruments. 615 7$aIndustrial electronics. 615 7$aMeasurement. 615 7$aTesting. 676 $a621 712 02$aIEEE Instrumentation and Measurement Society 801 0$bNTD 801 1$bNTD 801 2$bOCLCQ 801 2$bOCLCS 801 2$bIUL 801 2$bOCLCA 801 2$bDLC 801 2$bNSD 801 2$bU9S 801 2$bOCLCQ 801 2$bOCLCF 801 2$bOCLCO 801 2$bOCLCQ 801 2$bVT2 801 2$bOCLCO 801 2$bUKMGB 801 2$bNJT 801 2$bOCLCO 801 2$bOCLCQ 801 2$bUAB 801 2$bHNC 801 2$bOCLCL 801 2$bCUD 801 2$bTXJ 801 2$bM6U 801 2$bRCE 801 2$bAPUMS 801 2$bAU@ 801 2$bLVT 801 2$bUBQ 801 2$bAUD 801 2$bU3W 801 2$bOCLCQ 906 $aJOURNAL 912 $a9910625186403321 996 $aIEEE instrumentation & measurement magazine$9892568 997 $aUNINA