LEADER 04388nam  22007935  450 
001 9910616360003321
005 20251202141646.0
010   $a9783031110771$b(electronic bk.)
010   $z9783031110764
024 7 $a10.1007/978-3-031-11077-1
035   $a(MiAaPQ)EBC7101900
035   $a(Au-PeEL)EBL7101900
035   $a(CKB)24950433200041
035   $a(PPN)264953754
035   $a(BIP)85860969
035   $a(BIP)84585016
035   $a(DE-He213)978-3-031-11077-1
035   $a(EXLCZ)9924950433200041
100   $a20220928d2022      u|         0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIndexing of Crystal Diffraction Patterns $eFrom Crystallography Basics to Methods of Automatic Indexing /$fby Adam Morawiec
205   $a1st ed. 2022.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2022.
215   $a1 online resource (427 pages)
225 1 $aSpringer Series in Materials Science,$x2196-2812 ;$v326
300   $aIncludes index.
311 08$aPrint version: Morawiec, Adam Indexing of Crystal Diffraction Patterns Cham : Springer International Publishing AG,c2022 9783031110764 
327   $aGeometric crystallography -- Basic aspects of crystal diffraction -- Diffraction of high energy electrons -- Cartesian reference frames in diffractometry -- Indexing of single crystal diffraction patterns -- Ab-inito indexing of Laue patterns -- Indexing of powder diffraction patterns -- Indexing for orientation determination -- Indexing of spot-type diffraction patterns -- Complications in indexing -- Multigrain indexing -- Beyond diffraction by periodic crystals -- Quasicrystals -- Strain determination.
330   $aThis book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination. The book is intended equally for materials scientists curious about ?nuts and bolts? of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.
410  0$aSpringer Series in Materials Science,$x2196-2812 ;$v326
606   $aCrystallography
606   $aMetals
606   $aMaterials science$xData processing
606   $aElectrons$xDiffraction
606   $aInstrumental analysis
606   $aX-ray spectroscopy
606   $aMaterials$xMicroscopy
606   $aCrystallography and Scattering Methods
606   $aMetals and Alloys
606   $aComputational Materials Science
606   $aDiffraction
606   $aX-Ray Spectroscopy
606   $aMicroscopy
615  0$aCrystallography.
615  0$aMetals.
615  0$aMaterials science$xData processing.
615  0$aElectrons$xDiffraction.
615  0$aInstrumental analysis.
615  0$aX-ray spectroscopy.
615  0$aMaterials$xMicroscopy.
615 14$aCrystallography and Scattering Methods.
615 24$aMetals and Alloys.
615 24$aComputational Materials Science.
615 24$aDiffraction.
615 24$aX-Ray Spectroscopy.
615 24$aMicroscopy.
676   $a548
676   $a548.83
700   $aMorawiec$b Adam$01260243
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
912   $a9910616360003321
996   $aIndexing of Crystal Diffraction Patterns$92920209
997   $aUNINA