LEADER 01209nam  2200361   450 
001 9910586664703321
005 20221017114505.0
010   $a1-83968-230-2
035   $a(CKB)4950000000721880
035   $a(NjHacI)994950000000721880
035   $a(EXLCZ)994950000000721880
100   $a20221017d2022      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization /$fedited by Chandra Shakher Pathak, Samir Kumar
210  1$aLondon :$cIntechOpen,$d2022.
215   $a1 online resource (274 pages) $cillustrations
311   $a1-83968-229-9 
320   $aIncludes bibliographical references.
606   $aAtomic force microscopy
615  0$aAtomic force microscopy.
676   $a620.5
702   $aPathak$b Chandra Shakher
702   $aKumar$b Samir
801  0$bNjHacI
801  1$bNjHacl
906   $aBOOK
912   $a9910586664703321
996   $aRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization$92902600
997   $aUNINA