LEADER 01272nam 2200397 450 001 9910583383403321 005 20220907222809.0 010 $a0-12-813347-3 035 $a(CKB)4100000002037904 035 $a(MiAaPQ)EBC5231691 035 $a(NjHacI)994100000002037904 035 $a(EXLCZ)994100000002037904 100 $a20220907d2018 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aQuantitative Data Processing in Scanning Probe Microscopy $eSPM Applications for Nanometrology /$fPetr Klapetek 205 $aSecond edition. 210 1$aSan Diego :$cElsevier Science,$d[2018] 210 4$dİ2018 215 $a1 online resource (xviii, 397 pages) $cillustrations 225 1 $aMicro & nano technologies 320 $aIncludes bibliographical references and index. 410 0$aMicro & nano technologies. 606 $aScanning probe microscopy 615 0$aScanning probe microscopy. 676 $a620.5 700 $aKlapetek$b Petr$0996131 801 0$bNjHacI 801 1$bNjHacl 906 $aBOOK 912 $a9910583383403321 996 $aQuantitative data processing in scanning probe microscopy$92887579 997 $aUNINA