LEADER 04081nam 2201189z- 450 001 9910576878403321 005 20231214133151.0 035 $a(CKB)5720000000008391 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/84461 035 $a(EXLCZ)995720000000008391 100 $a20202206d2022 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aOptical In-Process Measurement Systems 210 $aBasel$cMDPI - Multidisciplinary Digital Publishing Institute$d2022 215 $a1 electronic resource (194 p.) 311 $a3-0365-3849-6 311 $a3-0365-3850-X 330 $aInformation is key, which means that measurements are key. For this reason, this book provides unique insight into state-of-the-art research works regarding optical measurement systems. Optical systems are fast and precise, and the ongoing challenge is to enable optical principles for in-process measurements. Presented within this book is a selection of promising optical measurement approaches for real-world applications. 606 $aTechnology: general issues$2bicssc 606 $aHistory of engineering & technology$2bicssc 610 $aspeckle photography 610 $ain-process measurement 610 $adeep rolling process 610 $ageneralized phase shifting interferometry 610 $adual-aperture common-path interferometer 610 $areal-time optical instrumentation 610 $aoptomechatronic systems 610 $aelectrical steel 610 $aoptical coherence tomography 610 $aOCT 610 $ascanning 610 $aprocess monitoring 610 $alaser material processing 610 $aspot compensation 610 $alow coherence interferometry 610 $aLCI 610 $awind lidar 610 $aDoppler lidar 610 $abistatic 610 $ametrology 610 $atraceability 610 $awind energy 610 $ameteorology 610 $adiffraction grating 610 $agrating pitch 610 $amode-locked femtosecond laser 610 $alaser diffraction 610 $adiffraction equation 610 $ameasurement uncertainty analysis 610 $aimage processing 610 $apattern recognition 610 $awind energy turbines 610 $aturbulence wedges 610 $acoherence scanning interferometry 610 $ain-process application 610 $aMirau interferometer 610 $avibration compensation 610 $ainterferometric distance sensor 610 $aoptical path length modulation 610 $aoscillating reference mirror 610 $ahairpin 610 $alaser welding 610 $asemantic segmentation 610 $adilated convolution 610 $asdu-net 610 $aspatter detection 610 $aquality assurance 610 $afast prediction time 610 $ain situ measurement 610 $aoptical metrology 610 $aquality control 610 $ainterferometry 610 $afringe projection 610 $acomputational shear interferometry 610 $acoherence function 610 $astructure function 610 $aadditive manufacturing 610 $amedium voltage switchgear 610 $aSF6 alternatives 610 $aUV-Vis spectroscopy 610 $agas mixing modeling 610 $amulticomponent diffusion analysis 610 $aexplosion 610 $acoal dust 610 $amethane 610 $aexplosion suppression 610 $aspectral characteristics 610 $aexplosion pressure 610 $aradiation intensity 610 $afree radicals 615 7$aTechnology: general issues 615 7$aHistory of engineering & technology 700 $aFischer$b Andreas$4edt$0222548 702 $aFischer$b Andreas$4oth 906 $aBOOK 912 $a9910576878403321 996 $aOptical In-Process Measurement Systems$93035619 997 $aUNINA