LEADER 04450nam 2201045z- 450 001 9910557701103321 005 20231214133656.0 035 $a(CKB)5400000000044546 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/76777 035 $a(EXLCZ)995400000000044546 100 $a20202201d2021 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aCharacterization of Nanomaterials: Selected Papers from 6th Dresden Nanoanalysis Symposiumc 210 $aBasel, Switzerland$cMDPI - Multidisciplinary Digital Publishing Institute$d2021 215 $a1 electronic resource (139 p.) 311 $a3-0365-0756-6 311 $a3-0365-0757-4 330 $aThis Special Issue ?Characterization of Nanomaterials? collects nine selected papers presented at the 6th Dresden Nanoanalysis Symposium, held at Fraunhofer Institute for Ceramic Technologies and Systems in Dresden, Germany, on 31 August 2018. Following the specific motto of this annual symposium ?Materials challenges?Micro- and nanoscale characterization?, it covered various topics of nanoscale materials characterization along the whole value and innovation chain, from fundamental research up to industrial applications. The scope of this Special Issue is to provide an overview of the current status, recent developments and research activities in the field of nanoscale materials characterization, with a particular emphasis on future scenarios. Primarily, analytical techniques for the characterization of thin films and nanostructures are discussed, including modeling and simulation. We anticipate that this Special Issue will be accessible to a wide audience, as it explores not only methodical aspects of nanoscale materials characterization, but also materials synthesis, fabrication of devices and applications. 517 $aCharacterization of Nanomaterials 606 $aTechnology: general issues$2bicssc 610 $aphysical vapor deposition 610 $amagnetron sputtering 610 $aAlN/Al coating 610 $asilicon substrate 610 $aresidual stresses 610 $awafer curvature method 610 $ananoscale residual stress profiling 610 $aindentation failure modes 610 $ananoindentation adhesion 610 $aintermetallic phases 610 $agrowth kinetics 610 $aAl-Ni system 610 $azinc oxide 610 $ananoparticles 610 $apaper transistors 610 $aprinted electronics 610 $aelectrolyte-gated transistors 610 $amicrowave synthesis 610 $aoxide dissociation 610 $adoping 610 $arare earth ions 610 $aupconversion 610 $aliquid alloys 610 $a2D materials 610 $athin films 610 $aGa-Sn-Zn alloys 610 $agallium alloys 610 $ananoanalysis 610 $alithium-ion 610 $anickel-manganese-cobalt oxide (NMC) 610 $aleaching 610 $arecycling 610 $arecover 610 $adegradation 610 $aSEM-EDX 610 $aRaman spectroscopy 610 $aresistive switching memories 610 $amulti-level cell 610 $acopper oxide 610 $agrain boundaries 610 $aaluminum oxide 610 $ap-type TFT 610 $ap-type oxide semiconductors 610 $aSnO electrical properties 610 $aoxide structure analysis 610 $aToF-SIMS 3D imaging 610 $acompositional depth profiling 610 $ahigh aspect ratio (HAR) structures 610 $asilicon doped hafnium oxide (HSO) ALD deposition 610 $alateral high aspect ratio (LHAR) 610 $aToF-SIMS analysis 615 7$aTechnology: general issues 700 $aZschech$b Ehrenfried$4edt$0950028 702 $aSinclair$b Robert$4edt 702 $aMartins$b Rodrigo$4edt 702 $aSebastiani$b Marco$4edt 702 $aSartori$b Sabrina$4edt 702 $aZschech$b Ehrenfried$4oth 702 $aSinclair$b Robert$4oth 702 $aMartins$b Rodrigo$4oth 702 $aSebastiani$b Marco$4oth 702 $aSartori$b Sabrina$4oth 906 $aBOOK 912 $a9910557701103321 996 $aCharacterization of Nanomaterials: Selected Papers from 6th Dresden Nanoanalysis Symposiumc$93030631 997 $aUNINA