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100   $a20220412d2021      uy             0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aModern characterization of electromagnetic systems and its associated metrology /$fMagdalena Salazar-Palma, Tapan K. Sarkar, Ming Da Zhu
210  1$aHoboken, New Jersey :$cJohn Wiley & Sons, Inc.,$d[2021]
210  4$d??2021
215   $a1 online resource (723 pages)
225 1 $aWiley - IEEE Ser.
311   $a1-119-07646-3 
320   $aIncludes bibliographical references and index.
410  0$aWiley - IEEE Ser.
606   $aElectromagnetic waves$xMeasurement
615  0$aElectromagnetic waves$xMeasurement.
676   $a537.12
700   $aSalazar-Palma$b Magdalena$0861617
702   $aSarkar$b Tapan
702   $aZhu$b Ming Da
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910555005303321
996   $aModern Characterization of Electromagnetic Systems and Its Associated Metrology$92816071
997   $aUNINA