LEADER 01432nam 2200445 450 001 9910536344603321 005 20200520144314.0 010 $a1-909821-72-1 035 $a(CKB)3830000000059596 035 $a(MiAaPQ)EBC5485043 035 $a(Au-PeEL)EBL5485043 035 $a(OCoLC)1039923385 035 $a(EXLCZ)993830000000059596 100 $a20180825d2008 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 14$aThe Jews of Vienna and the First World War /$fDavid Rechter 210 1$aOxford ;$aPortland, Oregon :$cThe Littman Library of Jewish Civilization,$d2008. 215 $a1 online resource (233 pages) 311 $a1-874774-65-X 311 $a1-904113-82-6 320 $aIncludes bibliographical references and index. 606 $aJews$zAustria$zVienna$xSocial conditions$y20th century 606 $aWorld War, 1914-1918$xJews$zAustria$zVienna 607 $aVienna (Austria)$xEthnic relations 608 $aElectronic books. 615 0$aJews$xSocial conditions 615 0$aWorld War, 1914-1918$xJews 676 $a305.892404361309049 700 $aRechter$b David$f1958-$01094917 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910536344603321 996 $aThe Jews of Vienna and the First World War$92614483 997 $aUNINA LEADER 01955nam 2200361 450 001 9910135404803321 005 20231208083648.0 010 $a0-7381-8687-2 024 7 $a10.1109/IEEESTD.2013.6617654 035 $a(CKB)3780000000092210 035 $a(NjHacI)993780000000092210 035 $a(EXLCZ)993780000000092210 100 $a20231208d2013 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEC 62860-1 $e2013(E) IEEE Std. 1620.1-2006 : Test methods for the characterization of organic transistor-based ring oscillators /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, New Jersey :$cIEEE,$d2013. 215 $a1 online resource (26 pages) 330 $aRecommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits, significant measurement errors can be introduced if the electricalcharacterization design-of-experiment is not properly addressed. This standard describes themost common sources of measurement error, particularly for high-impedance electricalmeasurements commonly required for printed and organic ring oscillators. This standard alsogives recommended practices in order to minimize and/or characterize the effect of measurementartifacts and other sources of error encountered while measuring printed and organic ringoscillators. 517 $aIEC 62860-1:2013(E) IEEE Std. 1620.1-2006: IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators 517 $aIEC 62860-1 606 $aOscillators, Electric 615 0$aOscillators, Electric. 676 $a621.381533 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a9910135404803321 996 $aIEC 62860-1$93646209 997 $aUNINA