LEADER 05498nam 22006855 450 001 9910480823503321 005 20200702045505.0 010 $a1-4757-2519-1 024 7 $a10.1007/978-1-4757-2519-3 035 $a(CKB)2660000000021749 035 $a(DE-He213)978-1-4757-2519-3 035 $a(MiAaPQ)EBC3084962 035 $a(PPN)238027910 035 $a(EXLCZ)992660000000021749 100 $a20130125d1996 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aTransmission Electron Microscopy$b[electronic resource] $eA Textbook for Materials Science /$fby David B. Williams, C. Barry Carter 205 $a1st ed. 1996. 210 1$aNew York, NY :$cSpringer US :$cImprint: Springer,$d1996. 215 $a1 online resource (XXIX, 729 p. 1722 illus.) 311 $a0-306-45247-2 311 $a0-306-45324-X 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $a1 The Transmission Electron Microscope -- 2 Scattering and Diffraction -- 3 Elastic Scattering -- 4 Inelastic Scattering and Beam Damage -- 5 Electron Sources -- 6 Lenses, Apertures, and Resolution -- 7 How to ?See? Electrons -- 8 Pumps and Holders -- 9 The Instrument -- 10 Specimen Preparation -- 11 Diffraction Patterns -- 12 Thinking in Reciprocal Space -- 13 Diffracted Beams -- 14 Bloch Waves -- 15 Dispersion Surfaces -- 16 Diffraction from Crystals -- 17 Diffraction from Small Volumes -- 18 Indexing Diffraction Patterns -- 19 Kikuchi Diffraction -- 20 Obtaining CBED Patterns -- 21 Using Convergent-Beam Techniques -- 22 Imaging in the TEM -- 23 Thickness and Bending Effects -- 24 Planar Defects -- 25 Strain Fields -- 26 Weak-Beam Dark-Field Microscopy -- 27 Phase-Contrast Images -- 28 High-Resolution TEM -- 29 Image Simulation -- 30 Quantifying and Processing HRTEM Images -- 31 Other Imaging Techniques -- 32 X-ray Spectrometry -- 33 The XEDS-TEM Interface -- 34 Qualitative X-ray Analysis -- 35 Quantitative X-ray Microanalysis -- 36 Spatial Resolution and Minimum Detectability -- 37 Electron Energy-Loss Spectrometers -- 38 The Energy-Loss Spectrum -- 39 Microanalysis with Ionization-Loss Electrons -- 40 Everything Else in the Spectrum -- Acknowledgements for Figures. 330 $aElectron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi­ of materials by completing the processing-structure-prop­ croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them­ to achieve specific sets of properties; the extraordinary abili­ selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM­ of all of these areas before one can hope to tackle signifi­ instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate­ be used with care and attention, in many cases involving rials education must include suitable courses in electron mi­ teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci­ for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively. 606 $aSpectroscopy 606 $aMicroscopy 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aSolid state physics 606 $aMaterials science 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aSolid State Physics$3https://scigraph.springernature.com/ontologies/product-market-codes/P25013 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 606 $aBiological Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/L26000 615 0$aSpectroscopy. 615 0$aMicroscopy. 615 0$aSurfaces (Physics). 615 0$aInterfaces (Physical sciences). 615 0$aThin films. 615 0$aSolid state physics. 615 0$aMaterials science. 615 14$aSpectroscopy and Microscopy. 615 24$aSurface and Interface Science, Thin Films. 615 24$aSolid State Physics. 615 24$aCharacterization and Evaluation of Materials. 615 24$aBiological Microscopy. 676 $a621.36 700 $aWilliams$b David B$4aut$4http://id.loc.gov/vocabulary/relators/aut$091773 702 $aCarter$b C. Barry$4aut$4http://id.loc.gov/vocabulary/relators/aut 906 $aBOOK 912 $a9910480823503321 996 $aTransmission Electron Microscopy$92295043 997 $aUNINA