LEADER 01104nam--2200361---450- 001 990001597860203316 005 20070904170146.0 010 $a978-88-7794-490-0 035 $a000159786 035 $aUSA01000159786 035 $a(ALEPH)000159786USA01 035 $a000159786 100 $a20040423h2007----km-y0itay50------ba 101 0 $aita 102 $aIT 105 $aa|||||||001yy 200 1 $aNatura picta$eUlisse Aldrovandi$fa cura di Alessandro Alessandrini, Alessandro Ceregato 210 $aBologna$cEditrice Compositori$dcopyr. 2007 215 $a670 p.$cill.$d24 cm 600 1$aAldrovandi,$bUlisse$xCelebrazioni 600 1$aAldrovandi,$bUlisse$xOpere$xIllustrazioni 676 $a509.2 702 1$aALESSANDRINI,$bAlessandro$f<1953- > 702 1$aCEREGATO,$bAlessandro 801 0$aIT$bsalbc$gISBD 912 $a990001597860203316 951 $aII.6. 88$b199048 L.M.$cII.6.$d00062022 959 $aBK 969 $aUMA 979 $aSIAV5$b10$c20040423$lUSA01$h1300 979 $aANNAMARIA$b90$c20070904$lUSA01$h1701 996 $aNatura picta$9854089 997 $aUNISA LEADER 05170nam 22006495 450 001 9910479874603321 005 20200702223528.0 010 $a3-662-02767-4 024 7 $a10.1007/978-3-662-02767-7 035 $a(CKB)2660000000028052 035 $a(SSID)ssj0000897312 035 $a(PQKBManifestationID)11488266 035 $a(PQKBTitleCode)TC0000897312 035 $a(PQKBWorkID)10901919 035 $a(PQKB)10382940 035 $a(DE-He213)978-3-662-02767-7 035 $a(MiAaPQ)EBC3098422 035 $a(PPN)238024628 035 $a(EXLCZ)992660000000028052 100 $a20130321d1992 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt 182 $cc 183 $acr 200 10$aSurface Analysis Methods in Materials Science$b[electronic resource] /$fedited by D.J. O'Connor, Brett A. Sexton, Roger St.C. Smart 205 $a1st ed. 1992. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d1992. 215 $a1 online resource (XXI, 453 p.) 225 1 $aSpringer Series in Surface Sciences,$x0931-5195 ;$v23 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a3-540-53611-6 311 $a3-662-02769-0 320 $aIncludes bibliographical references and index. 327 $a1. Solid Surfaces, Their Structure and Composition -- 2. UHV Basics -- 3. Electron Microscope Techniques for Surface Characterization -- 4. Sputter Depth Profiling -- 5. SIMS ? Secondary Ion Mass Spectrometry -- 6. Auger Spectroscopy and Scanning Auger Microscopy -- 7. X-Ray Photoelectron Spectroscopy -- 8. Fourier Transform Infrared Specroscopy of Surfaces -- 9. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis -- 10. Scanning Tunnelling Microscopy -- 11. Low Energy Ion Scattering -- 12. Reflection High Energy Electron Diffraction -- 13. Low Energy Electron Diffraction -- 14. Ultraviolet Photoelectron Spectroscopy of Solids -- 15. Spin Polarized Electron Techniques -- 16. Materials Technology -- 17. Characterization of Catalysts by Surface Analysis -- 18. Applications to Devices and Device Materials -- 19. Characterization of Oxidized Surfaces -- 20. Coated Steel -- 21. Thin Film Analysis -- 22. Identification of Adsorbed Species -- IV Appendix -- Acronyms Used in Surface and Thin Film Analysis -- Surface Science Bibliography. 330 $aThe idea for this book stemmed from a remark by Philip Jennings of Murdoch University in a discussion session following a regular meeting of the Australian Surface Science group. He observed that a text on surface analysis and applica­ tions to materials suitable for final year undergraduate and postgraduate science students was not currently available. Furthermore, the members of the Australian Surface Science group had the research experience and range of coverage of sur­ face analytical techniques and applications to provide a text for this purpose. A of techniques and applications to be included was agreed at that meeting. The list intended readership of the book has been broadened since the early discussions, particularly to encompass industrial users, but there has been no significant alter­ ation in content. The editors, in consultation with the contributors, have agreed that the book should be prepared for four major groups of readers: - senior undergraduate students in chemistry, physics, metallurgy, materials science and materials engineering; - postgraduate students undertaking research that involves the use of analytical techniques; - groups of scientists and engineers attending training courses and workshops on the application of surface analytical techniques in materials science; - industrial scientists and engineers in research and development seeking a description of available surface analytical techniques and guidance on the most appropriate techniques for particular applications. The contributors mostly come from Australia, with the notable exception of Ray Browning from Stanford University. 410 0$aSpringer Series in Surface Sciences,$x0931-5195 ;$v23 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aMaterials?Surfaces 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 615 0$aSurfaces (Physics). 615 0$aInterfaces (Physical sciences). 615 0$aThin films. 615 0$aMaterials?Surfaces. 615 14$aSurface and Interface Science, Thin Films. 615 24$aSurfaces and Interfaces, Thin Films. 676 $a530.417 702 $aO'Connor$b D.J$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aSexton$b Brett A$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aSmart$b Roger St.C$4edt$4http://id.loc.gov/vocabulary/relators/edt 906 $aBOOK 912 $a9910479874603321 996 $aSurface Analysis Methods in Materials Science$92116398 997 $aUNINA