LEADER 01410nam  2200385   450 
001 9910478905803321
010   $a87-7022-111-1
035   $a(CKB)4100000008736203
035   $a(MiAaPQ)EBC5829253
035   $a(EXLCZ)994100000008736203
100   $a20190808d2019      uy             0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /$fAndrej Rumiantsev
210  1$aGistrup, Denmark ;$aDelft, Netherlands :$cRiver Publishers,$d[2019]
210  4$dİ2019
215   $a1 online resource (278 pages)
225 1 $aRiver publishers series in electronic materials and devices
311   $a87-7022-112-X 
410  0$aRiver Publishers series in electronic materials and devices.
606   $aSemiconductors$xCharacterization
608   $aElectronic books.
615  0$aSemiconductors$xCharacterization.
676   $a621.38152
700   $aRumiantsev$b Andrej$0991364
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910478905803321
996   $aOn-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond$92268647
997   $aUNINA