LEADER 01557nam 2200517 450 001 9910467290403321 005 20200923020339.0 010 $a3-11-041608-5 035 $a(CKB)3850000000001216 035 $a(MiAaPQ)EBC4927018 035 $a(Au-PeEL)EBL4927018 035 $a(CaPaEBR)ebr11443049 035 $a(CaONFJC)MIL1036795 035 $a(OCoLC)1004556175 035 $a(EXLCZ)993850000000001216 100 $a20171011h20172017 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 00$aWood composites $ematerials, manufacturing and engineering. /$fedited by Alfredo Aguilera and J. Paulo Davim 210 1$aBerlin, [Germany] ;$aBoston, [Massachusetts] :$cDe Gruyter,$d2017. 210 4$dİ2017 215 $a1 online resource (210 pages) $cillustrations (some color) 225 1 $aAdvanced Composites,$x2192-8983 311 $a3-11-041607-7 320 $aIncludes bibliographical references at the end of each chapters and index. 410 0$aAdvanced composites. 606 $aEngineered wood 606 $aWood 606 $aComposite materials 608 $aElectronic books. 615 0$aEngineered wood. 615 0$aWood. 615 0$aComposite materials. 676 $a674.8 702 $aAguilera$b Alfredo 702 $aDavim$b J. Paulo 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910467290403321 996 $aWood Composites$91504503 997 $aUNINA LEADER 01424aam 2200373I 450 001 9910711391503321 005 20160205080659.0 024 8 $aGOVPUB-C13-58dd6aa06c405d42292b75d68350e343 035 $a(CKB)5470000002482112 035 $a(OCoLC)936670820 035 $a(EXLCZ)995470000002482112 100 $a20160205d1969 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aMethods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969. /$fW. Murray Bullis 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1969. 215 $a1 online resource 225 1 $aNBS technical note ;$v495 300 $a1969. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aBullis$b W. Murray$01387657 701 $aBullis$b W. Murray$01387657 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910711391503321 996 $aMethods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969$93547396 997 $aUNINA